David Han, Ph.D.

Associate Professor of Management Science and Statistics

Degrees 

  • Ph.D. McMaster University
  • M.Sc. McMaster University
  • B.Sc. McMaster University

About:

David Han is an Associate Professor in the Department of Management Science & Statistics. Dr. Han earned a Master of Science and Doctor of Philosophy in statistics from McMaster University in Canada after completing an Honors Bachelor of Science degree in biochemistry and an Honors Bachelor of Science degree in computer science and statistics with Minor in business. His main research interests include statistical modeling, data science and data analytics, operations research in the areas of reliability, survival analysis, lifetime and degradation analyses, predictive maintenance planning with applications to healthcare, biomedicine, chemometrics, cybersecurity, renewable energy and industrial engineering.

His work has appeared in numerous peer-reviewed journals such as IEEE Transactions on Reliability, Reliability Engineering & System Safety, Naval Research Logistics, Quality and Reliability Engineering International, Chemometrics & Intelligent Laboratory Systems, Quality Engineering, Computational Statistics & Data Analysis, Journal of Statistical Planning & Inference, Communications in Statistics, PLoS ONE, and others.

Dr. Han has taught physical and statistical/mathematical sciences over 23 years from the grade school to the university graduate levels. His teaching specialties include data science and analytics, probability and mathematical statistics, applied statistics, business statistics, engineering statistics, biostatistics and survival analysis. He received the University of Texas System Regents’ Outstanding Teaching Award, the UTSA President’s Distinguished Achievement Award for Teaching Excellence, the College of Business Faculty Teaching Excellence Award and the College of Business Dean’s Research Excellence Award. He is a member of the UTSA Academy of Distinguished Teaching Scholars and has been serving on numerous committees as well as actively serving as the president and vice president of the American Statistical Association chapter. In addition, he has been serving as an editorial board member and peer reviewer for numerous academic journals in broad and diverse disciplines.

Selected Publications:

  • “Parameter Estimation using EM Algorithm for Lifetimes from Step-stress and Constant-stress Accelerated Life Tests with Interval Monitoring,” with T. Bai, IEEE Transactions on Reliability, in print, 2020.
  • “Optimal Design of a Simple Step-stress Accelerated Life Test under Progressive Type-I Censoring with Non-uniform Durations: Comparison between Continuous and Interval inspections,” with T. Bai, Reliability Engineering & System Safety, in print, 2020.
  • “On the Existence of the Optimal Step-stress Accelerated Life Tests under Progressive Type-I Censoring,” IEEE Transactions on Reliability, in print, 2020.
  • “Expected Termination Times of Progressively Type-I Censored Step-stress Accelerated Life Tests under Continuous and Interval Inspections,” Statistica Neerlandica, Vol. 74, 2019, pp. 112-124.
  • “Optimal Design of a Simple Step-stress Accelerated Life Test under Progressive Type-I Censoring with Non-uniform Durations for Exponential Lifetimes,” Quality and Reliability Engineering International, Vol. 35, 2019, pp. 1297-1312.
  • “Bayesian Estimation of the Analyte Concentrations using the Sensor Responses and the Design Optimization of a Sensor System,” with K. Johnson, Chemometrics & Intelligent Laboratory Systems, Vol. 176, 2018, pp. 149-156.
  • “Optimal Accelerated Life Tests under a Cost Constraint with Non-uniform Stress Durations,” Quality Engineering, Vol. 29, 2017, pp. 409-430.
  • “Time and Cost Constrained Optimal Designs of Constant-stress and Step-stress Accelerated Life Tests,” Reliability Engineering & System Safety, Vol. 140, 2015, pp. 1-14.
  • “Inference for a Step-stress Model with Competing Risks from the Generalized Exponential Distribution under Type-I Censoring,” with D. Kundu, IEEE Transactions on Reliability, Vol. 64, 2015, pp. 31-43.
  • “Estimation in Step-stress Life Tests with Complementary Risks from the Exponentiated Exponential Distribution under Time Constraint and Its Applications to UAV Data,” Statistical Methodology, Vol. 23, 2015, pp. 103-122.
  • “Comparison between Constant-stress and Step-stress Accelerated Life Tests under Time Constraint,” with H.K.T. Ng, Naval Research Logistics, Vol. 60, 2013, pp. 541-556.
  • “Exact Inference for Progressively Type-I Censored Exponential Failure Data,” with N. Balakrishnan and G. Iliopoulos, Metrika, Vol. 73, 2011, pp. 335-358.
  • “Inference for a Simple Step-stress Model with Competing Risks for Failure from the Exponential Distribution under Time Constraint,” with N. Balakrishnan, Computational Statistics & Data Analysis, Vol. 54, 2010, pp. 2066-2081.
  • “Optimal Step-stress Testing for Progressively Type-I Censored Data from Exponential Distribution,” with N. Balakrishnan, Journal of Statistical Planning & Inference, Vol. 139, 2009, pp. 1782-1798.
  • “Exact Inference for a Simple Step-stress Model with Competing Risks for Failure from Exponential Distribution under Type-II Censoring,” with N. Balakrishnan, Journal of Statistical Planning & Inference, Vol. 138, 2008, pp. 4172-4186.